Double correlating interferometer scheme for measuring PM and AM noise

被引：7

作者：

Rubiola, E

Giordano, V

Groslambert, J

机构：

[1] Politecn Torino, Dipartimento Elettron, I-10129 Turin, Italy

[2] LPMO, F-25000 Besancon, France

来源：

ELECTRONICS LETTERS | 1998年 / 34卷 / 01期

关键词：

D O I：

10.1049/el:19980129

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

A new scheme is proposed to measure close-to-carrier PM and AM noise by means of correlation between two interferometric measurements. The most relevant feature is the ability to reject interferometric system noise, thus improving the sensitivity. Implementation and experimental results are discussed.

引用

页码：93 / 94

页数：2

共 3 条

[1] A study of noise phenomena in microwave components using an advanced noise measurement system [J].