Improved two-dimensional product imaging: The real-time ion-counting method

被引：177

作者：

Chang, BY ^{[1
]}

Hoetzlein, RC ^{[1
]}

Mueller, JA ^{[1
]}

Geiser, JD ^{[1
]}

Houston, PL ^{[1
]}

机构：

[1] Cornell Univ, Dept Chem, Ithaca, NY 14853 USA

来源：

REVIEW OF SCIENTIFIC INSTRUMENTS | 1998年 / 69卷 / 04期

关键词：

D O I：

10.1063/1.1148824

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

A novel ion-counting method for significantly improving the spatial resolution and detection sensitivity of two-dimensional product imaging in molecular beam experiments is presented. The method makes use of real-time digital image processing to retrieve, threshold, and determine the local maximum of each ion hitting a microchannel plate assembly. The current version can process data at rates up to 3.07 Mbyte/s, and methods for accelerating this rate are proposed. (C) 1998 American Institute of Physics.

引用

页码：1665 / 1670

页数：6

共 22 条

[1] STATE-RESOLVED DIFFERENTIAL CROSS-SECTIONS FOR CROSSED-BEAM AR-NO INELASTIC-SCATTERING BY DIRECT ION IMAGING [J].