Calculation of x-ray refraction from near-edge absorption data only

被引：8

作者：

Jacobsen, C ^{[1
]}

Wang, S ^{[1
]}

Yun, WB ^{[1
]}

Frigo, S ^{[1
]}

机构：

[1] SUNY Stony Brook, Dept Phys & Astron, Stony Brook, NY 11794 USA

来源：

OPTICAL CONSTANTS OF MATERIALS FOR UV TO X-RAY WAVELENGTHS | 2004年 / 5538卷

关键词：

Kramers-Kronig; anomalous dispersion; XANES; NEXAFS;

D O I：

10.1117/12.560160

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

Near-edge x-ray absorption resonances provide information on molecular orbital structure; these resonances can be exploited in x-ray spectromicroscopy to give sub-50-nanometer resolution images with chemical state sensitivity. At the same time, radiation damage sets a limit to the resolution that can be obtained in absorption mode. Phase contrast imaging may provide another means of chemical state imaging with lower radiation dose. We describe here the use of experimentally measured near-edge absorption data to estimate near-edge phase resonances. This is accomplished by splicing the near-edge data into reference data and carrying out a numerical integration of the Kramers-Kronig relation.

引用

页码：23 / 30

页数：8

共 31 条

[1] CHEMICAL CONTRAST IN X-RAY MICROSCOPY AND SPATIALLY RESOLVED XANES SPECTROSCOPY OF ORGANIC SPECIMENS [J].

ADE, H ;

ZHANG, X ;

CAMERON, S ;

COSTELLO, C ;

KIRZ, J ;

WILLIAMS, S .

SCIENCE, 1992, 258 (5084) :972-975

[2]

[Anonymous], 1993, XRAY SCI TECHNOLOGY

[3]

[Anonymous], NATURWISSENSHAFTEN

[4] AN X-RAY INTERFEROMETER [J].

BONSE, U ;

HART, M .

APPLIED PHYSICS LETTERS, 1965, 6 (08) :155-&

[5] Kramers-Kronig transforms calculation with a fast convolution algorithm [J].

Bruzzoni, P ;

Carranza, RM ;

Lacoste, JRC ;

Crespo, EA .

ELECTROCHIMICA ACTA, 2002, 48 (04) :341-347

[6] Direct measurement of index of refraction in the extreme-ultraviolet wavelength region with a novel interferometer [J].

Chang, C ;

Anderson, E ;

Naulleau, P ;

Gullikson, E ;

Goldberg, K ;

Attwood, D .

OPTICS LETTERS, 2002, 27 (12) :1028-1030

[7] Phase objects in synchrotron radiation hard x-ray imaging [J].

Cloetens, P ;

Barrett, R ;

Baruchel, J ;

Guigay, JP ;

Schlenker, M .

JOURNAL OF PHYSICS D-APPLIED PHYSICS, 1996, 29 (01) :133-146

[8] Novel interferometer in the soft x-ray region [J].

Dambach, S ;

Backe, H ;

Doerk, T ;

Eftekhari, N ;

Euteneuer, H ;

Gorgen, F ;

Hagenbuck, F ;

Kaiser, KH ;

Kettig, O ;

Kube, G ;

Lauth, W ;

Schope, H ;

Steinhof, A ;

Tonn, T ;

Walcher, T .

PHYSICAL REVIEW LETTERS, 1998, 80 (25) :5473-5476

[9] PHASE-CONTRAST IMAGING OF WEAKLY ABSORBING MATERIALS USING HARD X-RAYS [J].

DAVIS, TJ ;

GAO, D ;

GUREYEV, TE ;

STEVENSON, AW ;

WILKINS, SW .

NATURE, 1995, 373 (6515) :595-598

[10]

Einstein A., 1918, VERHANDLUNGEN DTSCH, V20, P86

← 1 2 3 4 →