Evidence for power-law frequency dependence of intrinsic dielectric response in the CaCu3Ti4O12 -: art. no. 144101

被引:106
作者
Tselev, A [1 ]
Brooks, CM
Anlage, SM
Zheng, H
Salamanca-Riba, L
Ramesh, R
Subramanian, MA
机构
[1] Univ Maryland, Ctr Superconduct Res, Dept Phys, College Pk, MD 20742 USA
[2] Univ Maryland, Dept Phys, College Pk, MD 20742 USA
[3] DuPont Co Inc, Cent Res & Dev, Expt Stn, Wilmington, DE 19880 USA
[4] Univ Maryland, Dept Mat & Nucl Engn, College Pk, MD 20742 USA
来源
PHYSICAL REVIEW B | 2004年 / 70卷 / 14期
关键词
D O I
10.1103/PhysRevB.70.144101
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
We investigated the dielectric response of CaCu3Ti4O12 (CCTO) thin films grown epitaxially on LaAlO3 (001) substrates by pulsed laser deposition. The dielectric response of the films was found to be strongly dominated by a power law in frequency, typical of materials with localized hopping charge carriers, in contrast to the Debye-like response of the bulk material. The film conductivity decreases with annealing in oxygen, and it suggests that oxygen deficit is a cause of the relatively high film conductivity. With increase of the oxygen content, the room temperature frequency response of the CCTO thin films changes from the response indicating the presence of some relatively low conducting capacitive layers to purely power law, and then toward a frequency independent response with a relative dielectric constant epsilon(')similar to10(2). The film conductance and dielectric response decrease upon decrease of the temperature, with dielectric response being dominated by the power-law frequency dependence. Below similar to80 K, the dielectric response of the films is frequency independent with epsilon(') close to 10(2). The results provide another piece of evidence for an extrinsic, Maxwell-Wagner type, origin of the colossal dielectric response of the bulk CCTO material, connected with electrical inhomogeneity of the bulk material.
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页码:144101 / 1
页数:8
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