Essential elements of time-of-flight mass spectrometry in combination with the inductively coupled plasma ion source

被引：45

作者：

Guilhaus, M ^{[1
]}

机构：

[1] Univ New S Wales, Sch Chem, Sydney, NSW 2052, Australia

来源：

SPECTROCHIMICA ACTA PART B-ATOMIC SPECTROSCOPY | 2000年 / 55卷 / 10期

关键词：

time-of-flight mass spectrometry; inductively coupled plasma mass spectrometry; transient inlet systems; quadrupole; orthogonal acceleration; axial acceleration;

D O I：

10.1016/S0584-8547(00)00261-5

中图分类号：

O433 [光谱学];

学科分类号：

0703 ; 070302 ;

摘要：

Time-of-flight mass spectrometry (TOFMS) is once again an important method of mass analysis. Commercial ICP-MS instruments with TOF mass analyzers have recently become available and this article provides an overview of key issues in the combination of TOFMS with the ICP source. The advantages of TOFMS for inductively coupled plasma mass spectrometry (ICP-MS) and the technological challenges in this combination are discussed in terms of basic principles of TOFMS. The concepts described include: sources of peak broadening; ion gating, duty-cycle and mass analyzer efficiency; signal digitizing in the nanosecond regime; comparisons with scanning mass analyzers; and selective quenching of ion signals in TOFMS. (C) 2000 Elsevier Science B.V. All rights reserved.

引用

页码：1511 / 1525

页数：15

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