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Electron attachment to simple organic acids

被引：32
作者：
Pelc, A
Sailer, W
Scheier, P
Mason, NJ
Illenberger, E
Märk, TD
机构：
[1] Leopold Franzens Univ, Inst Ionenphys, A-6020 Innsbruck, Austria
[2] Comenius Univ, Dept Plasma Phys, Bratislava 84248, Slovakia
来源：
VACUUM | 2003年 / 70卷 / 2-3期
关键词：
dissociative electron attachment; organic acid; mass spectrometry;
D O I：
10.1016/S0042-207X(02)00682-6
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
Low energy (from 0 up to 13 eV) electron attachment to formic and acetic acid is studied for the first time by means of mass spectrometric detection of the product anions. The energy spread of electron beam was 120 meV (acetic acid) and 140 meV in the case of formic acid. For all negative fragments estimates for the absolute partial cross sections were obtained. In the case of both acids, the (parent-H)(-) ion yield shows a structure that is tentatively ascribed to the vibrational excitation in the formate anion. (C) 2003 Elsevier Science Ltd. All rights reserved.
引用
收藏
页码：429 / 433
页数：5
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