Structure detection in low intensity X-ray images

被引：62

作者：

Starck, JL ^{[1
]}

Pierre, M ^{[1
]}

机构：

[1] CEA Saclay, DSM, DAPNIA, SAP, F-91191 Gif Sur Yvette, France

来源：

ASTRONOMY & ASTROPHYSICS SUPPLEMENT SERIES | 1998年 / 128卷 / 02期

关键词：

X-rays; general; methods; data analysis; statistical; techniques; image processing;

D O I：

10.1051/aas:1998150

中图分类号：

P1 [天文学];

学科分类号：

0704 ;

摘要：

In the context of assessing and characterizing structures in X-ray images, we compare different approaches. Most often the intensity level is very low and necessitates a special treatment of Poisson statistics. The method based on wavelet function histogram is shown to be the most reliable one. We also present a multiresolution filtering method based on the wavelet coefficients detection. Comparative results are presented by means of a simulated cluster of galaxies.

引用

页码：397 / 407

页数：11

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