Microimaging and tomography with chemical speciation

Materials science deals with the study of the morphology of samples, their chemical composition and the relation between both. One general problem is the preservation of the sample throughout the different analyses, like it is often the case for classical chemical analysis. Destruction-free chemical speciation in three dimensions with micrometer resolution can be achieved by combining X-ray spectroscopy and imaging techniques. Highly brilliant radiation is needed for this purpose available at 3rd generation synchrotrons such as the ESRF. X-ray absorption near-edge spectroscopy (XANES) is a non-destructive well-known and established technique in chemistry. By scanning the X-ray energy in the vicinity (50-100 eV) of the absorption edge of an element, information can be obtained about the oxidation state of the probed atoms. The (conventional) technique mainly employed until now applies to homogeneous, specifically prepared flat samples where the measured signal can be considered as the average over the whole irradiated volume. This restriction for samples is partially released when the XANES method is combined with imaging techniques. 2D resolved data is acquired using area detectors or by scanning with a focussed beam. X-ray absorption tomography is a method of choice for investigating the 3D structure of objects and its dual energy version is used for getting information about the 3D distribution of a given element within the sample. Although the combination of XANES and tomography seems to be a natural extension of dual-energy tomography, in practice several experimental problems have to be overcome in order to obtain useable data. In the following we describe the results of XANES imaging and tomography obtained measuring a phantom sample of pure molybdenum compounds using a FreLoN 2000 camera system at the ESRF undulator beamline ID22. This system allowed making volume resolved distinctions between different oxidation states with spatial resolution in the micrometer range. (C) 2002 Published by Elsevier Science B.V.