In situ imaging of shearing contacts in the surface forces apparatus

被引：21

作者：

Golan, Y ^{[1
]}

Drummond, C

Israelachvili, J

Tenne, R

机构：

[1] Ben Gurion Univ Negev, Dept Mat Engn, IL-84105 Beer Sheva, Israel

[2] Univ Calif Santa Barbara, Dept Chem Engn, Santa Barbara, CA 93106 USA

[3] Univ Calif Santa Barbara, Dept Mat, Santa Barbara, CA 93106 USA

[4] Weizmann Inst Sci, Dept Mat & Interfaces, IL-76100 Rehovot, Israel

来源：

WEAR | 2000年 / 245卷 / 1-2期

基金：

美国国家科学基金会;

关键词：

multiple beam interferometry; surface force apparatus; atomic force microscopy; nanoparticles; inorganic fullerenes;

D O I：

10.1016/S0043-1648(00)00478-6

中图分类号：

TH [机械、仪表工业];

学科分类号：

0802 ;

摘要：

Multiple beam interferometry (MBI) can be used in the surface forces apparatus for in situ topographical imaging in real-time of the contact between two shearing surfaces at ultrahigh resolution in the normal direction at the same time as friction forces are measured. Simultaneous measurements were made of the friction forces between two shearing mica surfaces separated by WS2 (inorganic) fullerene, and non-fullerene WS2 nanoparticle additives in tetradecane. The results were correlated with the very different transfer layers formed in each case, as visualized by in situ MBI and ex situ atomic force microscopy. (C) 2000 Elsevier Science S.A. All rights reserved.

引用

页码：190 / 195

页数：6

共 43 条

[1] New theoretical and experimental probes of tribochemistry in model bearing contacts [J].