Transient deformation measurement using dual-pulse addition ESPI

被引:4
作者
Farrant, DI [1 ]
Kaufmann, GH
Petzing, JN
Tyrer, JR
Oreb, BF
Kerr, D
机构
[1] CSIRO, Lindfield, NSW, Australia
[2] Univ Nacl Rosario, Inst Fis Rosario, CONICET, UNR, RA-2000 Rosario, Argentina
[3] Univ Nacl Rosario, Fac Ciencias Exactas, Dept Fis, RA-2000 Rosario, Argentina
[4] Univ Loughborough, Dept Mech Engn, Loughborough, Leics, England
来源
ULTRAHIGH- AND HIGH-SPEED PHOTOGRAPHY AND IMAGE-BASED MOTION MEASUREMENT | 1997年 / 3173卷
关键词
electronic speckle pattern interferometry; transient deformation; vibration measurement addition fringes; Fourier transform method; phase unwrapping;
D O I
10.1117/12.294507
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
An electronic speckle pattern interferometry system based on a frequency-doubled twin Nd:YAG laser emitting dual pulses at a TV camera field rate (50 Hz) was developed to analyse addition fringes generated by transient deformation of a test object. The main advance has been the automatic, quantitative analysis of dual-pulsed addition ESPI data by the introduction of carrier fringes and the application of Fourier methods. The carrier fringes are introduced between dual pulses by tilting the reference beam with a mirror driven by a galvanometer. The resulting deformation-modulate addition fringes are enhanced with a variance filter before evaluation of the phase distribution using a Fourier transform method with bandpass filtering. From the wrapped phase distribution, a continuous phase map is reconstructed using an iterative weighted least-squares unwrapper. The linear phase distribution associated with the carrier fringes is removed by evaluating it with a least-squares fitting algorithm. preliminary results obtained for a thin plate submitted to an acoustic shock show the suitability of the system for the quantitative: evaluation of transient deformation fields.
引用
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页码:132 / 140
页数:9
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