Effects of cantilever buckling on vector piezoresponse force microscopy imaging of ferroelectric domains in BiFeO3 nanostructures

被引：57

作者：

Nath, Ramesh ^{[1
,2
]}

Hong, Seungbum ^{[1
]}

Klug, Jeffrey A. ^{[1
,3
]}

Imre, Alexandra ^{[4
]}

Bedzyk, Michael J. ^{[1
,3
,5
]}

Katiyar, Ram S. ^{[2
]}

Auciello, Orlando ^{[1
,4
]}

机构：

[1] Argonne Natl Lab, Div Mat Sci, Lemont, IL 60439 USA

[2] Univ Puerto Rico, Inst Funct Nanomat, San Juan, PR 00931 USA

[3] Northwestern Univ, Dept Phys & Astron, Evanston, IL 60208 USA

[4] Argonne Natl Lab, Ctr Nanoscale Mat, Lemont, IL 60439 USA

[5] Northwestern Univ, Dept Mat Sci & Engn, Evanston, IL 60208 USA

来源：

APPLIED PHYSICS LETTERS | 2010年 / 96卷 / 16期

关键词：

D O I：

10.1063/1.3327831

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

Systematic studies are presented on the effects of cantilever buckling in vector piezoresponse force microscopy (V-PFM) imaging of polarization domains in thin-film based (001)-oriented BiFeO3 nanostructures, as observed through the coupling of out-of-plane and in-plane PFM images. This effect is a strong function of the laser spot position on the cantilever, being strongest at the free end, and insignificant at 60% of the cantilever length from the pivot point. This finding provides a unique approach to V-PFM imaging of ferroelectric polarization domains, yielding three dimensional PFM images without sample rotation in the plane. (C) 2010 American Institute of Physics. [doi:10.1063/1.3327831]

引用

页数：3

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