Spatial versus temporal phase shifting in electronic speckle-pattern interferometry: noise comparison in phase maps

被引：37

作者：

Burke, J ^{[1
]}

Helmers, T ^{[1
]}

机构：

[1] Carl von Ossietzky Univ Oldenburg, Fachbereich Phys 8, D-26111 Oldenburg, Germany

来源：

APPLIED OPTICS | 2000年 / 39卷 / 25期

关键词：

D O I：

10.1364/AO.39.004598

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

Temporal and spatial phase shifting in electronic speckle-pattern interferometry are compared quantitatively with respect to the quality of the resultant deformation phase maps. On the basis of an analysis of the noise in sawtooth fringes a figure of merit is defined and measured for various in-plane and out-of-plane sensitive electronic speckle-pattern interferometry configurations. Varying quantities like the object-illuminating intensity, the beam ratio, the speckle size and shape, and the fringe density allows characteristic behaviors of both phase-shifting methods to be explored. (C) 2000 Optical Society of America OCIS codes: 120.6160, 120.5050, 120.2650.

引用

页码：4598 / 4606

页数：9

共 24 条

[1] Spatial phase shifting in electronic speckle pattern interferometry: Minimization of phase reconstruction errors [J].