Lightning-induced effects on lossy MTL terminated on arbitrary loads: A wavelet approach

Lightning-induced electromagnetic effects propagating on multiconductor transmission-line (MTL) structures are a severe threat for many electronic devices. The solution of uniform MTL equations with frequency-dependent losses and nonlinear loads is proposed in the wavelet domain. Some remarkable features of the wavelets are presented and applied in order to speed up the solution time of the induced effects and to open possibilities to use them for signal integrity analysis. Validation of the obtained results with others given by well-established numerical techniques is also presented.