A note on using patent statistics to obtain competition indicators

被引：6

作者：

Ramani, SV ^{[1
]}

de Looze, MA ^{[1
]}

机构：

[1] Univ Pierre Mendes France, INRA, Grenoble Unit, F-38070 Grenoble 9, France

来源：

SCIENTOMETRICS | 2000年 / 49卷 / 03期

关键词：

Data Base; Recent Article; Patent Statistic; Research Competence; Subsequent Implementation;

D O I：

10.1023/A:1010545908787

中图分类号：

TP39 [计算机的应用];

学科分类号：

081203 ; 0835 ;

摘要：

In a recent article a set of indicators have been proposed drawing upon patent statistics, which are meant to describe and compare firm and national research competence. However this article has raised more questions on the validity of such indicators as well as on their use. We have thus examined these issues so as to clarify the nature of the problems involved in the construction of competence and competitive indicators of firms and nations and their subsequent implementation on data bases.

引用

页码：511 / 515

页数：5

共 3 条

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[3] TECHNOLOGY PRODUCTION AND TECHNOLOGY PURCHASE IN INDIAN INDUSTRY - AN ECONOMETRIC-ANALYSIS [J].

DEOLALIKAR, AB ;

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