Electrical characterization of electrochemically grown single copper nanowires

被引：142

作者：

Toimil-Molares, ME

Höhberger, EM

Schaeflein, C

Blick, RH

Neumann, R

Trautmann, C

机构：

[1] Gesell Schwerionenforsch mbH, D-64291 Darmstadt, Germany

[2] Univ Munich, Ctr Neurosci, D-80539 Munich, Germany

[3] Univ Munich, Sekt Phys, D-80539 Munich, Germany

来源：

APPLIED PHYSICS LETTERS | 2003年 / 82卷 / 13期

关键词：

D O I：

10.1063/1.1563741

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

Single- and poly-crystalline copper wires with diameters down to 30 nm are grown in etched ion-track membranes. Individual nanowires are isolated and contacted by means of optical lithography. Electronic transport properties and oxidation processes are investigated. Depending on the oxidation state, the wire resistance varies between a few hundred ohms and several megaohms, enabling its usage as metallic or semiconducting structural elements for devices on the nanometer scale. (C) 2003 American Institute of Physics.

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页码：2139 / 2141

页数：3

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