Adatom transport on strained Cu(001): Surface crowdions

被引:33
作者
Xiao, W [1 ]
Greaney, PA [1 ]
Chrzan, DC [1 ]
机构
[1] Univ Calif Berkeley, Dept Mat Sci & Engn, Berkeley, CA 94720 USA
关键词
D O I
10.1103/PhysRevLett.90.156102
中图分类号
O4 [物理学];
学科分类号
0702 ;
摘要
Surface strain is often suggested as a means to control the self-assembled growth of nanostructures. Strain affects both the kinetics of nucleation and the free energies of formation of the desired nanostructure. It is demonstrated here that diffusion on some strained surfaces may be mediated by newly identified adatom transport mechanism: the formation and motion of a surface crowdion.
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页数:4
相关论文
共 20 条
[1]   CRITICAL CLUSTER-SIZE - ISLAND MORPHOLOGY AND SIZE DISTRIBUTION IN SUBMONOLAYER EPITAXIAL-GROWTH [J].
AMAR, JG ;
FAMILY, F .
PHYSICAL REVIEW LETTERS, 1995, 74 (11) :2066-2069
[2]   DYNAMICS OF IRREVERSIBLE ISLAND GROWTH DURING SUBMONOLAYER EPITAXY [J].
BALES, GS ;
CHRZAN, DC .
PHYSICAL REVIEW B, 1994, 50 (09) :6057-6067
[3]   SCALING ANALYSIS OF DIFFUSION-MEDIATED ISLAND GROWTH IN SURFACE-ADSORPTION PROCESSES [J].
BARTELT, MC ;
EVANS, JW .
PHYSICAL REVIEW B, 1992, 46 (19) :12675-12687
[4]   Self-diffusion of adatoms, dimers, and vacancies on Cu(100) [J].
Boisvert, G ;
Lewis, LJ .
PHYSICAL REVIEW B, 1997, 56 (12) :7643-7655
[5]   Self-organized growth of cluster arrays [J].
Bromann, K ;
Giovannini, M ;
Brune, H ;
Kern, K .
EUROPEAN PHYSICAL JOURNAL D, 1999, 9 (1-4) :25-28
[6]   ISLAND MORPHOLOGY AND ADATOM ENERGY BARRIERS DURING HOMOEPITAXY ON CU(001) [J].
DURR, H ;
WENDELKEN, JF ;
ZUO, JK .
SURFACE SCIENCE, 1995, 328 (1-2) :L527-L532
[7]   DIFFUSION PATH FOR AN AL ADATOM ON AL(001) [J].
FEIBELMAN, PJ .
PHYSICAL REVIEW LETTERS, 1990, 65 (06) :729-732
[8]  
FOILES SM, 1986, PHYS REV B, V33, P7983, DOI 10.1103/PhysRevB.33.7983
[9]  
GREANEY PA, UNPUB
[10]   ANISOTROPY IN NUCLEATION AND GROWTH OF 2-DIMENSIONAL ISLANDS DURING HOMOEPITAXY ON HEX RECONSTRUCTED AU(100) [J].
GUNTHER, S ;
KOPATZKI, E ;
BARTELT, MC ;
EVANS, JW ;
BEHM, RJ .
PHYSICAL REVIEW LETTERS, 1994, 73 (04) :553-556