Determination of metallic impurities in high-purity type IIa diamond grown by high-pressure and high-temperature synthesis using neutron activation analysis

被引：13

作者：

Kaneko, J ^{[1
]}

Yonezawa, C

Kasugai, Y

Sumiya, H

Nishitani, T

机构：

[1] Japan Atom Energy Res Inst, Tokai, Ibaraki 3191195, Japan

[2] Sumitomo Elect Ind Ltd, Itami Res Labs, Itami, Hyogo 6640016, Japan

来源：

关键词：

HPHT diamond; metallic impurities; neutron activation analysis;

D O I：

10.1016/S0925-9635(00)00357-5

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

Metallic impurities in high-purity type IIa and conventional type To diamond single crystals grown by high-pressure and high-temperature (HPHT) synthesis were determined by neutron activation analysis using thermal neutrons. Metallic impurities of Fe, Co, Cr and other minor elements were detected in the high-purity type IIa diamond crystal. The typical quantities of these metallic impurities were a few ppb. The influence of these metallic impurities on the electrical properties of the type IIa diamond crystal was practically negligible compared with nitrogen and boron impurities behaving as a donor and an acceptor, respectively. In addition to the impurities detected in the type IIa diamond crystal, Ni impurities of several hundreds of ppb were detected in conventional type Ib diamond crystals. A difference in molten metal solvents used in the synthesis of each diamond crystal resulted in the difference in metallic impurities. (C) 2000 Elsevier Science B.V. All rights reserved.

引用

页码：2019 / 2023

页数：5

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