Limitations of a relaxation oscillator in capacitance measurements

被引:26
作者
Liu, YL [1 ]
Chen, S [1 ]
Nakayama, M [1 ]
Watanabe, K [1 ]
机构
[1] Shizuoka Univ, Elect Res Inst, Hamamatsu, Shizuoka 4328011, Japan
关键词
capacitance measurement; comparator; operational amplifier; relaxation oscillator; signal processing;
D O I
10.1109/19.872917
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Oscillation periods of a relaxation oscillator consisting of an op-amp-based integrator and a comparator are measured over a wide range of RC integration constants, and the results are compared with theoretical values derived in terms of the finite gain-bandwidth (GB) product and the slew rate of an op-amp and the response delay of a comparator. The comparison validates the theoretical derivation which gives the design criteria of a relaxation oscillator for capacitance measurements and sensor signal processing.
引用
收藏
页码:980 / 983
页数:4
相关论文
共 7 条
[1]   CAPACITANCE MEASUREMENT BASED ON AN OPERATIONAL-AMPLIFIER CIRCUIT - ERROR DETERMINATION AND REDUCTION [J].
AWAD, SS .
IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, 1988, 37 (03) :379-382
[2]  
Daryanani G., 1976, PRINCIPLES ACTIVE NE
[3]   2-WIRE BRIDGE-TO-FREQUENCY CONVERTER [J].
HUIJSING, JH ;
VANROSSUM, GA ;
VANDERLEE, M .
IEEE JOURNAL OF SOLID-STATE CIRCUITS, 1987, 22 (03) :343-349
[4]   HIGHLY ACCURATE RESISTANCE DEVIATION TO FREQUENCY-CONVERTER WITH PROGRAMMABLE SENSITIVITY AND RESOLUTION [J].
JOHNSON, CD ;
ALRICHEH, H .
IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, 1986, 35 (02) :178-181
[5]   A high-resolution, linear resistance-to-frequency converter [J].
Mochizuki, K ;
Watanabe, K .
IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, 1996, 45 (03) :761-764
[6]   A relaxation-oscillator-based interface for high-accuracy ratiometric signal processing of differential-capacitance transducers [J].
Mochizuki, K ;
Watanabe, K ;
Masuda, T ;
Katsura, M .
IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, 1998, 47 (01) :11-15
[7]   A novel low-cost capacitive-sensor interface [J].
vanderGoes, FML ;
Meijer, GCM .
IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, 1996, 45 (02) :536-540