Improved X-ray powder diffraction data for Ti2AlN

被引：8

作者：

Gamarnik, MY ^{[1
]}

Barsoum, MW ^{[1
]}

El-Raghy, T ^{[1
]}

机构：

[1] Drexel Univ, Dept Mat Engn, Philadelphia, PA 19104 USA

来源：

POWDER DIFFRACTION | 2000年 / 15卷 / 04期

关键词：

D O I：

10.1017/S0885715600011167

中图分类号：

TB3 [工程材料学];

学科分类号：

0805 ; 080502 ;

摘要：

A complete set of d spacings, intensities, and h, k, l indexes for Ti2AlN has been determined from;Y-ray powder diffraction. The lattice parameters are a=2.989(2) Angstrom, c=13.614(5) Angstrom; in good agreement with previous work. The new set of results comprises seven reflections not present in the current Ti2AlN PDF card No. 18-70. Furthermore, a new set of relative intensities are reported that are in better agreement with the calculated values than they are with those listed in the PDF card. (C) 2000 International Centre for Diffraction Data. [S0885-7156(00)00603-5].

引用

页码：241 / 242

页数：2

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