Grazing incidence in-plane X-ray diffraction study on oriented copper phthalocyanine thin films

被引：27

作者：

Ofuji, M

Inaba, K

Omote, K

Hoshi, H

Takanishi, Y

Ishikawa, K

Takezoe, H

机构：

[1] Tokyo Inst Technol, Grad Sch Sci & Engn, Dept Organ & Polymer Mat, Meguro Ku, Tokyo 1528552, Japan

[2] Rigaku Corp, Xray Res Lab, Akishima, Tokyo 1968666, Japan

来源：

JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS | 2002年 / 41卷 / 08期

关键词：

phthalocyanine; vacuum deposition; orientation; grazing incidence X-ray diffraction; reciprocal space map;

D O I：

10.1143/JJAP.41.5467

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

Uniaxially aligned vacuum deposited films of copper phthalocyanine (CuPc) have been studied by means of angle-dispersive grazing-incidence X-ray diffraction. The lateral structure of the top surface of a 100-nm-thick film was successfully probed. It was revealed that the microcrystals near the surface have a finite in-plane distribution with a full-width at half maximum of 17.5degrees. In-plane diffraction profiles were transformed into a reciprocal space map that reproduced the electron diffraction pattern of a CuPc thin film reported previously.

引用

页码：5467 / 5471

页数：5

共 27 条

[1] ORIENTATION OVERGROWTH OF METAL-PHTHALOCYANINES ON SURFACE OF SINGLE CRYSTALS .I. VACUUM-CONDENSED FILMS ON MUSCOVITE [J].

ASHIDA, M .

BULLETIN OF THE CHEMICAL SOCIETY OF JAPAN, 1966, 39 (12) :2625-+

[2] UNIT CELL METASTABLE-FORM CONSTANTS OF VARIOUS PHTHALOCYANINES [J].

ASHIDA, M ;

UYEDA, N ;

SUITO, E .

BULLETIN OF THE CHEMICAL SOCIETY OF JAPAN, 1966, 39 (12) :2616-+

[3] Light emitting devices using vacuum deposited organic thin films [J].

Burrows, PE ;

Bulovic, V ;

Gu, G ;

Kozlov, V ;

Forrest, SR ;

Thompson, ME .

THIN SOLID FILMS, 1998, 331 (1-2) :101-105

[4] Simultaneous analysis of total reflection X-ray diffraction and fluorescence from copper-phthalocyanine thin films during evaporation process [J].

Hayashi, K ;

Horiuchi, T ;

Matsushige, K .

JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS, 1995, 34 (12A) :6478-6482

[5] INSITU X-RAY-OBSERVATION OF MOLECULAR-STRUCTURE IN ORGANIC THIN-FILMS DURING EVAPORATION PROCESS BY TOTAL REFLECTION INPLANE X-RAY DIFFRACTOMETER [J].

HAYASHI, K ;

ISHIDA, K ;

HORIUCHI, T ;

MATSUSHIGE, K .

JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS, 1992, 31 (12A) :4081-4085

[6] NEW EVALUATION METHOD OF EVAPORATED ORGANIC THIN-FILMS BY ENERGY DISPERSIVE-X-RAY DIFFRACTOMETER [J].

HORIUCHI, T ;

FUKAO, K ;

MATSUSHIGE, K .

JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS & EXPRESS LETTERS, 1987, 26 (11) :L1839-L1841

[7] STRUCTURAL EVALUATION OF EPITAXIALLY GROWN ORGANIC EVAPORATED-FILMS BY TOTAL-REFLECTION X-RAY DIFFRACTOMETER [J].

ISHIDA, K ;

HAYASHI, K ;

YOSHIDA, Y ;

HORIUCHI, T ;

MATSUSHIGE, K .

JOURNAL OF APPLIED PHYSICS, 1993, 73 (11) :7338-7343

[8] Molecular aggregation state of n-octadecyltrichlorosilane monolayer prepared at an air/water interface [J].

Kojio, K ;

Ge, SR ;

Takahara, A ;

Kajiyama, T .

LANGMUIR, 1998, 14 (05) :971-974

[9] Evaluation of electrical properties of evaporated thin films of metal-free, copper and lead phthalocyanines by in-situ field effect measurements [J].

Kudo, K ;

Sumimoto, T ;

Hiraga, K ;

Kuniyoshi, S ;

Tanaka, K .

JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS, 1997, 36 (11) :6994-6998

[10] Highly aligned α-type copper phthalocyanine formed on rubbed polyimide alignment layer [J].

Manaka, T ;

Taguchi, K ;

Ishikawa, K ;

Takezoe, H .

JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS, 2000, 39 (08) :4910-4911

← 1 2 3 →