Area detector based photon correlation in the regime of short data batches: Data reduction for dynamic x-ray scattering

被引：128

作者：

Lumma, D ^{[1
]}

Lurio, LB

Mochrie, SGJ

Sutton, M

机构：

[1] MIT, Dept Phys, Cambridge, MA 02139 USA

[2] MIT, Ctr Mat Sci & Engn, Cambridge, MA 02139 USA

[3] McGill Univ, Dept Phys, Montreal, PQ H3A 2T8, Canada

来源：

REVIEW OF SCIENTIFIC INSTRUMENTS | 2000年 / 71卷 / 09期

关键词：

D O I：

10.1063/1.1287637

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

A method for reducing time sequences of raw scattering images to intensity time-autocorrelation functions is presented. The procedure is based on the use of a charge coupled device (CCD) area detector, and optimized for operating in the regime of short data batches. Its application to x-ray photon correlation spectroscopy (XPCS) measurements is described in detail. Using a slow-scan CCD, we explain how to achieve data acquisition on a 30 ms or faster time scale, while simultaneously acquiring data from many coherence areas in parallel. The statistical uncertainties of the acquired XPCS data are quantified experimentally, and compared to the theoretically expected noise levels of the correlation functions. (C) 2000 American Institute of Physics. [S0034-6748(00)03509-7].

引用

页码：3274 / 3289

页数：16

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