Damage from proton irradiation of vertical-cavity surface-emitting lasers

被引:18
作者
Paxton, AH [1 ]
Carson, RF
Schone, H
Taylor, EW
Choquette, KD
Hou, HQ
Lear, KL
Warren, ME
机构
[1] USAF, Phillips Lab, VTMC, Kirtland AFB, NM 87117 USA
[2] Sandia Natl Labs, Albuquerque, NM 87185 USA
关键词
D O I
10.1109/23.658958
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Damage resulting from irradiating oxide-confined vertical-cavity surface-emitting lasers became significant (threshold shift approximate to 20%, peak power degradation approximate to 20%) at fluence levels approaching 1 x 10(13) protons/cm(2). The threshold current shifted to higher values, and the peak light output power decreased. Forward-current annealing led to partial recovery of the performance of two of the three lasers for which annealing was attempted. Recent results[1-3] on proton-implanted devices are summarized in a table.
引用
收藏
页码:1893 / 1897
页数:5
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