Secondary emission monitor for low-interception monitoring (SLIM): An innovative nondestructive beam monitor for the extraction lines of a hadrontherapy center

被引：6

作者：

Badano, L ^{[1
]}

Ferrando, O

Klatka, T

Koziel, M

Molinari, G

Pezzetta, M

机构：

[1] TERA Fdn, Milan, Italy

[2] CERN, Geneva, Switzerland

[3] AGH Univ Sci & Technol, Dept Elect, Krakow, Poland

来源：

IEEE TRANSACTIONS ON NUCLEAR SCIENCE | 2004年 / 51卷 / 06期

关键词：

D O I：

10.1109/TNS.2004.839101

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

Real-time monitoring of hadrontherapy beam intensities and profiles is a critical issue for the optimization of the dose delivery to the patient tumour tissue, the patient safety, and the operation of the accelerator complex. For this purpose, an innovative beam monitor, based on the secondary emission of electrons by a nonperturbative, submicrometer-thick Al target placed directly in the extracted beam path, is being proposed. The secondary electrons, accelerated by an electrostatic focusing system, are detected by a monolithic silicon position sensitive sensor, which provides the beam intensity and position with a precision of 1 mm at a 10-kHz frame rate. The conceptual design and the engineering study optimized for hadrontherapy are presented together with the results of the laboratory tests with thermoionic electrons and the first measurements in a hadron beam.

引用

页码：2990 / 2998

页数：9

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