Iron passivity in borate buffer - Formation of a deposit layer and its influence on the semiconducting properties

被引:73
作者
Buchler, M [1 ]
Schmuki, P [1 ]
Bohni, H [1 ]
机构
[1] ETH Honggerberg, Inst Mat Chem & Corros, Swiss Fed Inst Technol, CH-8093 Zurich, Switzerland
关键词
D O I
10.1149/1.1838311
中图分类号
O646 [电化学、电解、磁化学];
学科分类号
081704 ;
摘要
The formation, growth, and dissolution of the passive film on iron in neutral and alkaline solutions was investigated using a light reflectance technique. It was found that depending on the hydrodynamic conditions the formation of a hydroxide layer can take place during passivation. The strong influence of the hydrodynamic conditions can explain many contradictory results in the literature concerning the presence of a hydroxide layer on the protecting oxide film. Furthermore, the hydroxide layer affects capacitance and photocurrent measurements which are frequently used to obtain information about the semiconducting properties of the passive film on iron. In photoelectrochemical experiments the incoming photon flux is attenuated by the hydroxide layer which results in a decrease of photocurrent intensity. In ac-impedance measurements the potential dependence of the capacitance is qualitatively not affected; but a significantly increased frequency dispersion of the results is observed.
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页码:609 / 614
页数:6
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