X-Ray reflection studies on the monolayer-mediated growth of mesostructured MCM-41 silica at the air/water interface

被引：23

作者：

Roser, SJ ^{[1
]}

Patel, HM ^{[1
]}

Lovell, MR ^{[1
]}

Muir, JE ^{[1
]}

Mann, S ^{[1
]}

机构：

[1] Univ Bath, Dept Chem, Bath BA2 7AY, Avon, England

来源：

CHEMICAL COMMUNICATIONS | 1998年 / 07期

关键词：

D O I：

10.1039/a800777b

中图分类号：

O6 [化学];

学科分类号：

0703 ;

摘要：

X-Ray reflection has been used to study the nucleation and growth of thin films of a silica-surfactant mesophase (MCM-41) at the air/water interface in the presence and absence of an insoluble lipid monolayer of phosphatidylcholine; the rate of self-assembly and structural order of films comprising up to four micellar layers were enhanced under the lipid monolayer.

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页码：829 / 830

页数：2

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