Optical properties of quasi-tetragonal BiFeO3 thin films

被引：146

作者：

Chen, P. ^{[1
]}

Podraza, N. J. ^{[2
]}

Xu, X. S. ^{[1
]}

Melville, A. ^{[3
]}

Vlahos, E. ^{[4
]}

Gopalan, V. ^{[4
]}

Ramesh, R. ^{[5
,6
]}

Schlom, D. G. ^{[3
]}

Musfeldt, J. L. ^{[1
]}

机构：

[1] Univ Tennessee, Dept Chem, Knoxville, TN 37996 USA

[2] Penn State Univ, Dept Elect Engn, University Pk, PA 16802 USA

[3] Cornell Univ, Dept Mat Sci & Engn, Ithaca, NY 14853 USA

[4] Penn State Univ, Dept Mat Sci & Engn, University Pk, PA 16802 USA

[5] Univ Calif Berkeley, Dept Mat Sci & Engn, Berkeley, CA 94720 USA

[6] Univ Calif Berkeley, Lawrence Berkeley Lab, Div Mat Sci, Berkeley, CA 94720 USA

来源：

APPLIED PHYSICS LETTERS | 2010年 / 96卷 / 13期

关键词：

bismuth compounds; charge exchange; dielectric thin films; epitaxial growth; spectral line shift; ROOM-TEMPERATURE; FERROELECTRICITY; POLARIZATION;

D O I：

10.1063/1.3364133

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

Optical transmission spectroscopy and spectroscopic ellipsometry were used to extract the optical properties of an epitaxially grown quasi-tetragonal BiFeO3 thin film in the near infrared to near ultraviolet range. The absorption spectrum is overall blue shifted compared with that of rhombohedral BiFeO3, with an absorption onset near 2.25 eV, a direct 3.1 eV band gap, and charge transfer excitations that are similar to 0.4 eV higher than those of the rhombohedral counterpart. We interpret these results in terms of structural strain and local symmetry breaking.

引用

页数：3

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