Investigations on the physical properties of the polycrystalline ZnS thin films deposited by the chemical bath deposition method

被引:132
作者
Gode, F.
Gumus, C. [1 ]
Zor, M.
机构
[1] Cukurova Univ, Dept Phys, TR-01330 Adana, Turkey
[2] Univ Anadolu, Dept Phys, TR-26470 Eskisehir, Turkey
关键词
optical properties; X-ray diffraction; chemical bath deposition; zinc sulfide; electrical properties;
D O I
10.1016/j.jcrysgro.2006.10.266
中图分类号
O7 [晶体学];
学科分类号
0702 ; 070205 ; 0703 ; 080501 ;
摘要
Transparent and polycrystalline zinc sulfide (ZnS) thin films were prepared by the chemical bath deposition (CBD) technique onto glass substrates deposited at 80 degrees C using aqueous solution of zinc acetate, thiourea, triethanolamine and tri-sodium citrate at a pH of about 10.55. Triethanolamine and tri-sodium citrate were used as complexing agents. The thickness of the films, which were calculated from the interference patterns around 400-800 nm maxima and minima wavelengths, varied from 403 to 934 nm in the visible range. UV-visible spectrophotometric measurement showed transperancy from 66% to 87% of the films with a direct allowed energy band gap in the range of 3.79-3.93 eV. X-ray diffraction (XRD) patterns prove crystallinity of deposited films that crystallize in the hexagonal phase of ZnS. The ZnS thin films were characterized by XRD, energy dispersive X-ray analysis (EDX) and optical absorption spectra. The current-voltage characteristic of polycrystalline ZnS films grown by CBD are reported. (c) 2006 Elsevier B.V. All rights reserved.
引用
收藏
页码:136 / 141
页数:6
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