Imaging the degradation of polymer light-emitting devices

被引：23

作者：

Dane, J ^{[1
]}

Gao, J ^{[1
]}

机构：

[1] Queens Univ, Dept Phys, Kingston, ON K7L 3N6, Canada

来源：

APPLIED PHYSICS LETTERS | 2004年 / 85卷 / 17期

关键词：

D O I：

10.1063/1.1810213

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

Anode-to-cathode spatially resolved study of polymer light-emitting device degradation has been performed based on a massive planar device structure. The unique device configuration of the extremely large planar frozen-junction light-emitting electrochemical cell allows for the study of device degradation by direct imaging. Constant current stress for an extended period results in a very unusual net luminance increase as opposed to luminance decay. Imaging of the emission zone has shown changes that are consistent with polymer degradation by the loss of electron mobility. (C) 2004 American Institute of Physics.

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页码：3905 / 3907

页数：3

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