Template languages for fault monitoring of timed discrete event processes

被引:73
作者
Pandalai, DN [1 ]
Holloway, LE
机构
[1] Motorola Labs, Schaumburg, IL 60196 USA
[2] Univ Kentucky, Dept Elect Engn, Lexington, KY 40506 USA
[3] Univ Kentucky, Ctr Robot & Mfg Syst, Lexington, KY 40506 USA
基金
美国国家科学基金会; 美国国家航空航天局;
关键词
discrete event system; fault detection; timed models;
D O I
10.1109/9.855548
中图分类号
TP [自动化技术、计算机技术];
学科分类号
0812 ;
摘要
This paper introduces a new framework for modeling discrete event processes. This framework, called condition templates, allows the modeling of processes in which both single-instance and multiple-instance behaviors are exhibited concurrently. A single-instance behavior corresponds to a trace from a single finite-state process, and a multiple-instance behavior corresponds to the timed interleavings of an unspecified number of identical processes operating at the same time. The template framework allows the modeling of correct operation for systems consisting of concurrent mixtures of both single and multiple-instance behaviors. This representation can then be used in on-line fault monitoring for confirming the correct operation of a system. In order to analyze the modeling power of condition templates, we compare the class of timed languages representable by template models with classes of timed languages from timed automats models, It is shown that templates are able to model timed languages corresponding to single and multiple-instance behaviors and combinations thereof. Templates can thus represent languages that could not be represented or monitored using timed automata alone.
引用
收藏
页码:868 / 882
页数:15
相关论文
共 16 条
[1]  
Alefeld G., 1983, INTRO INTERVAL ARITH
[2]  
Alur R., 1992, LECT NOTES COMPUTER, V600
[3]  
Chen Y.-L., 1997, P 1997 AM CONTR C AL
[4]   ANALYTICAL REDUNDANCY AND THE DESIGN OF ROBUST FAILURE-DETECTION SYSTEMS [J].
CHOW, EY ;
WILLSKY, AS .
IEEE TRANSACTIONS ON AUTOMATIC CONTROL, 1984, 29 (07) :603-614
[5]  
DAS SR, IN PRESS IEEE T SYST
[6]  
DERSIN P, 1986, P IEEE C DEC CONTR A
[7]  
Heymann M., 1990, IEEE Control Systems Magazine, V10, P103, DOI 10.1109/37.56284
[8]  
Holloway L. E., 1990, Proceedings of Rensselaer's Second International Conference on Computer Integrated Manufacturing, P252, DOI 10.1109/CIM.1990.128107
[9]  
Holloway L. E., 1996, INTEGRATED COMPUTER, V3
[10]  
HOLLOWAY LE, 1994, PROCEEDINGS OF THE 1994 AMERICAN CONTROL CONFERENCE, VOLS 1-3, P701