Defect detection in textured materials by optical filtering with structured detectors and self-adaptable masks

被引：29

作者：

Ciamberlini, C ^{[1
]}

Francini, F ^{[1
]}

Longobardi, G ^{[1
]}

Sansoni, P ^{[1
]}

Tiribilli, B ^{[1
]}

机构：

[1] IST NAZL OTTICA, I-50125 FLORENCE, ITALY

来源：

OPTICAL ENGINEERING | 1996年 / 35卷 / 03期

关键词：

mask; Fourier transform; texture; filter; pattern recognition;

D O I：

10.1117/1.600663

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

An optical method using Fourier transformation and spatial filtering is used to reveal defects in textured materials in real time. New optical structured filter types were developed including a self-adaptable mask made of photochromic polymers. The characteristics of these materials make possible very promising applications in pattern recognition such as that represented by a fabric. (C) 1996 Society of Photo-Optical Instrumentation Engineers.

引用

页码：838 / 844

页数：7

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