Performance evaluation of an optoelectronic oscillator

被引：57

作者：

Römisch, S

Kitching, J

Ferrè-Pikal, E

Hollberg, L

Walls, FL

机构：

[1] Natl Inst Stand & Technol, Boulder, CO 80303 USA

[2] Univ Wyoming, Laramie, WY 82071 USA

来源：

IEEE TRANSACTIONS ON ULTRASONICS FERROELECTRICS AND FREQUENCY CONTROL | 2000年 / 47卷 / 05期

关键词：

Fourier transforms - Frequencies - Mathematical models - Optoelectronic devices - Parameter estimation - Phase measurement - Signal noise measurement;

D O I：

10.1109/58.869060

中图分类号：

O42 [声学];

学科分类号：

070206 ; 082403 ;

摘要：

Phase noise measurements of an optoelectronic oscillator (OEO) at frequencies less than 10 Hz from the carrier (10.6 GHz) as well as the measured Allan variance are presented for the first time. The system has a measured single-side-band (SSB) phase-noise of -123 dB/Ha at 10 kHz from the carrier and a sigma(y)(tau) = 10(-10) for an integration time between 1 and 10 seconds. The importance of amplifier phase-noise and environmental fluctuations in determining the noise of the oscillator at these low Fourier frequencies is verified experimentally and analyzed using a generalized model of noise sources in the OEOs. This analysis then allows prediction of the oscillator performance from measured parameters of individual components in the system.

引用

页码：1159 / 1165

页数：7

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