Ion beam interaction with stripper gas - Key for AMS at sub MeV

被引：45

作者：

Jacob, SAW ^{[1
]}

Suter, M

Synal, HA

机构：

[1] ETH Honggerberg, Inst Particle Phys, CH-8093 Zurich, Switzerland

[2] ETH Honggerberg, Paul Scherrer Inst, CH-8093 Zurich, Switzerland

来源：

NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS | 2000年 / 172卷

关键词：

charge distribution; scattering of atoms and molecules; ion molecule collisions; cross-sections of atoms and molecules; ion scattering;

D O I：

10.1016/S0168-583X(00)00205-6

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

The understanding of the beam interaction with stripper gas is most relevant in order to maximize yield, stability and precision, and to minimize both beam loss and background for future dedicated compact AMS systems. Charge state distribution, molecule destruction and angular straggling processes for carbon beams in Ar, N-2 and CO I gas have been measured for stripping energies between 200 and 600 keV at the new ETH/PSI small AMS facility. Results are presented and compared with corresponding models. (C) 2000 Elsevier Science B.V. All rights reserved.

引用

页码：235 / 241

页数：7

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