SiGe power HBT's for low-voltage, high-performance RF applications

被引:46
作者
Burghartz, JN [1 ]
Plouchart, JO
Jenkins, KA
Webster, CS
Soyuer, M
机构
[1] IBM Corp, Thomas J Watson Res Ctr, Yorktown Heights, NY 10598 USA
[2] IBM Microelect, Essex Junction, VT 05452 USA
关键词
D O I
10.1109/55.663528
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Silicon-Germanium (SiGe) power heterojunction bipolar transistors (I-IBT's) are fabricated by using two or ten device unit cells with an emitter area of 5 x 0.5 x 16.5 mu mw(2) each. The large power transistor features 1 W rf output power at 3-dB gain compression, 3.5 V bias, and 2.4 GHz with a maximum power-added-efficiency (PAE) of 48% for Class A/B operation. At a supply voltage of 1.5 V, the transistor delivers a 3-dB rf output power of 150 mW with a PAE of 47%. It is shown that a high collector doping level is advantageous for low-voltage operation, Further, by using special bias sense ports, the interconnect losses are found to degrade the device performance to a considerable degree.
引用
收藏
页码:103 / 105
页数:3
相关论文
共 6 条
[1]   Monolithic spiral inductors fabricated using a VLSI Cu-damascene interconnect technology and low-loss substrates [J].
Burghartz, JN ;
Edelstein, DC ;
Jenkins, KA ;
Jahnes, C ;
Uzoh, C ;
OSullivan, EJ ;
Chan, KK ;
Soyuer, M ;
Roper, P ;
Cordes, S .
IEDM - INTERNATIONAL ELECTRON DEVICES MEETING, TECHNICAL DIGEST 1996, 1996, :99-102
[2]   75-GHZ FT SIGE-BASE HETEROJUNCTION BIPOLAR-TRANSISTORS [J].
PATTON, GL ;
COMFORT, JH ;
MEYERSON, BS ;
CRABBE, EF ;
SCILLA, GJ ;
DEFRESART, E ;
STORK, JMC ;
SUN, JYC ;
HARAME, DL ;
BURGHARTZ, JN .
IEEE ELECTRON DEVICE LETTERS, 1990, 11 (04) :171-173
[3]   1-W SiGe power HBT's for mobile communication [J].
Schuppen, A ;
Gerlach, S ;
Dietrich, H ;
Wandrei, D ;
Seiler, U ;
Konig, U .
IEEE MICROWAVE AND GUIDED WAVE LETTERS, 1996, 6 (09) :341-343
[4]  
VENDELIN GD, 1990, MICROWAVE CIRCUIT DE, P9
[5]  
VERLEIJEN M, 1995, IEEE MTT S DIG, P563
[6]   Large-signal modeling of self-heating, collector transit-time, and RF-breakdown effects in power HBT's [J].
Wei, CJ ;
Hwang, JCM ;
Ho, WJ ;
Higgins, JA .
IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES, 1996, 44 (12) :2641-2647