Application of surface chemical analysis tools for characterization of nanoparticles

被引：210

作者：

Baer, D. R. ^{[1
]}

Gaspar, D. J. ^{[2
]}

Nachimuthu, P. ^{[1
]}

Techane, S. D. ^{[3
,4
]}

Castner, D. G. ^{[3
,4
]}

机构：

[1] Pacific NW Natl Lab, Environm Mol Sci Lab, Richland, WA 99352 USA

[2] Pacific NW Natl Lab, Energy & Environm Directorate, Richland, WA 99352 USA

[3] Univ Washington, Natl ESCA & Surface Anal Ctr Biomed Problems, Dept Bioengn, Seattle, WA 98195 USA

[4] Univ Washington, Natl ESCA & Surface Anal Ctr Biomed Problems, Dept Chem Engn, Seattle, WA 98195 USA

来源：

ANALYTICAL AND BIOANALYTICAL CHEMISTRY | 2010年 / 396卷 / 03期

关键词：

Nanoparticles; Nanotechnology; X-ray spectroscopy (XPS XRF EDX); Catalysts; RAY PHOTOELECTRON-SPECTROSCOPY; WALLED CARBON NANOTUBES; AUGER-ELECTRON-SPECTROSCOPY; TOF-SIMS; OXIDE NANOPARTICLES; SHELL NANOPARTICLES; IRON NANOPARTICLES; QUANTITATIVE XPS; SCANNING PROBE; PARTICLE-SIZE;

D O I：

10.1007/s00216-009-3360-1

中图分类号：

Q5 [生物化学];

学科分类号：

071010 ; 081704 ;

摘要：

The important role that surface chemical analysis methods can and should play in the characterization of nanoparticles is described. The types of information that can be obtained from analysis of nanoparticles using Auger electron spectroscopy (AES), X-ray photoelectron spectroscopy (XPS), time-of-flight secondary-ion mass spectrometry (TOF-SIMS), low-energy ion scattering (LEIS), and scanning-probe microscopy (SPM), including scanning tunneling microscopy (STM) and atomic force microscopy (AFM), are briefly summarized. Examples describing the characterization of engineered nanoparticles are provided. Specific analysis considerations and issues associated with using surface-analysis methods for the characterization of nanoparticles are discussed and summarized, with the impact that shape instability, environmentally induced changes, deliberate and accidental coating, etc., have on nanoparticle properties.

引用

页码：983 / 1002

页数：20

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