Near-field Raman spectroscopy using a sharp metal tip

被引：110

作者：

Hartschuh, A ^{[1
]}

Anderson, N ^{[1
]}

Novotny, L ^{[1
]}

机构：

[1] Univ Rochester, Inst Opt, Rochester, NY 14627 USA

来源：

JOURNAL OF MICROSCOPY-OXFORD | 2003年 / 210卷

关键词：

carbon nanotubes; near-field microscopy; surface-enhanced Raman scattering;

D O I：

10.1046/j.1365-2818.2003.01137.x

中图分类号：

TH742 [显微镜];

学科分类号：

摘要：

Near-field Raman spectroscopy with a spatial resolution of 20 nm is demonstrated by raster scanning a sharp metal tip over the sample surface. The method is used to image vibrational modes of single-walled carbon nanotubes. By combining optical and topographical signals rendered by the single-walled carbon nanotubes, we can separate near-field and far-field contributions and quantify the observed Raman enhancement factors.

引用

收藏

页码：234 / 240

页数：7

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