Enhanced depth of field integral imaging with sensor resolution constraints

被引:80
作者
Martínez-Cuenca, R
Saavedra, G
Martínez-Corral, M
Javidi, B
机构
[1] Univ Valencia, Dept Opt, E-46100 Burjassot, Spain
[2] Univ Connecticut, Dept Elect & Comp Engn, Storrs, CT 06269 USA
来源
OPTICS EXPRESS | 2004年 / 12卷 / 21期
关键词
D O I
10.1364/OPEX.12.005237
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
One of the main challenges in integral imaging is to overcome the limited depth of field. Although it is widely assumed that such limitation is mainly imposed by diffraction due to lenslet imaging, we show that the most restricting factor is the pixelated structure of the sensor (CCD). In this context, we demonstrate that by proper reduction of the fill factor of pickup microlenses, the depth of field can be substantially improved with no deterioration of lateral resolution. (C) 2004 Optical Society of America.
引用
收藏
页码:5237 / 5242
页数:6
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