Current signatures: Application

被引：62

作者：

Gattiker, AE ^{[1
]}

Maly, W ^{[1
]}

机构：

[1] Carnegie Mellon Univ, Pittsburgh, PA 15213 USA

来源：

ITC - INTERNATIONAL TEST CONFERENCE 1997, PROCEEDINGS: INTEGRATING MILITARY AND COMMERCIAL COMMUNICATIONS FOR THE NEXT CENTURY | 1997年

关键词：

D O I：

10.1109/TEST.1997.639608

中图分类号：

TP3 [计算技术、计算机技术];

学科分类号：

0812 ;

摘要：

Analysis of IC technology trends indicates that Iddq testing may be approaching its limits of applicability. The new concept of the current signature may expand this limit under the condition that an appropriate current-signature-based test methodology is developed. This paper is a first step toward such a goat. Pt is focused on current signature step detection in a noisy test environment. Application of current signatures in die selection and defect diagnosis is discussed as well.

引用

页码：156 / 165

页数：10