Hot-electron effects in two-dimensional hopping with a large localization length

被引：36

作者：

Gershenson, ME

Khavin, YB

Reuter, D

Schafmeister, P

Wieck, AD

机构：

[1] Rutgers State Univ, Serin Phys Lab, Piscataway, NJ 08854 USA

[2] Ruhr Univ Bochum, Lehrstuhl Angew Festkoerperphys, D-44780 Bochum, Germany

来源：

PHYSICAL REVIEW LETTERS | 2000年 / 85卷 / 08期

关键词：

D O I：

10.1103/PhysRevLett.85.1718

中图分类号：

O4 [物理学];

学科分类号：

0702 ;

摘要：

We have studied nonlinear effects in the resistance of a two-dimensional system with a large localization length on both sides of the crossover from weak to strong localization. It is shown that nonlinearity in the hopping regime is due to electron overheating rather than the field effects. This qualitatively new behavior is a signature of a two-dimensional hopping transport with a large localization length.

引用

页码：1718 / 1721

页数：4

共 37 条

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[2]

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[3]

[Anonymous], ZH EKSP TEOR FIZ

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