Stress-induced birefringence control in optical planar waveguides

被引:18
作者
Zhao, XL [1 ]
Li, CF
Xu, YZ
机构
[1] Harbin Inst Technol, Dept Phys, Harbin 15001, Peoples R China
[2] Wuhan Res Inst Posts & Telecom, Accelink Technol Co Ltd, Wuhan 430074, Peoples R China
关键词
D O I
10.1364/OL.28.000564
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
For what is to our knowledge the first time, the thermal-stress formula in analytical form is derived for the core layer in an optical planar waveguide by the thin-film approximation, which is based on a closed-form solution in multilayered isotropic structures off the edges. This formula indicates that elastic, thermal, and structural parameters can affect the magnitude of the stress. Using the formula, one can remove thermal stress and hence stress-induced birefringence by proper waveguide design. (C) 2003 Optical Society of America.
引用
收藏
页码:564 / 566
页数:3
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