Purification of tellurium to 6N+ by quadruple zone refining

被引：15

作者：

Munirathnam, NR ^{[1
]}

Prasad, DS ^{[1
]}

Sudheer, C ^{[1
]}

Prakash, TL ^{[1
]}

机构：

[1] IDA, Ctr Mat Elect Technol, HCL Post, Hyderabad 500051, Andhra Pradesh, India

来源：

JOURNAL OF CRYSTAL GROWTH | 2003年 / 254卷 / 1-2期

关键词：

impurities; purification; segregation; x-ray diffraction; elemental solids; metals;

D O I：

10.1016/S0022-0248(03)01141-2

中图分类号：

O7 [晶体学];

学科分类号：

0702 ; 070205 ; 0703 ; 080501 ;

摘要：

The purification method for refining of tellurium to 6N + using quadruple zone refining is described. Trace impurities at ppb/ppt level are analyzed using inductively coupled plasma mass spectrometry (ICPMS). These results are compared with similar trace impurities content in tellurium matrix purified by analogous methods and characterized by various proven analytical techniques. Periodic dependence on the atomic number of relative impurities concentration in the input (5N Te) to the out put tellurium (6N +) is discussed. The selenium in tellurium matrix is found to be 0.4 ppb after zone refining. (C) 2003 Elsevier Science B.V. All rights reserved.

引用

页码：262 / 266

页数：5

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BULLETIN OF MATERIALS SCIENCE, 2002, 25 (02) :79-83

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