Threshold characteristics of InGaAsP/InP multiple quantum well lasers

被引:77
作者
Asryan, LV
Gun'ko, NA
Polkovnikov, AS
Zegrya, GG
Suris, RA
Lau, PK
Makino, T
机构
[1] AF Ioffe Phys Tech Inst, St Petersburg 194021, Russia
[2] Nortel Adv Technol, Ottawa, ON K1Y 4H7, Canada
[3] SUNY Stony Brook, Stony Brook, NY 11794 USA
关键词
D O I
10.1088/0268-1242/15/12/306
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
A theoretical analysis and computer simulation of the threshold current density j(th) and characteristic temperature T-0 of multiple quantum well lasers (MQWLs) are presented. Together with the spontaneous radiative recombination, the Auger recombination and the lateral diffusive leakage of carriers from the active region are included into the model. A first-principle calculation of the: Auger recombination current is performed. It is shown that the lateral diffusive leakage current is controlled by the radiative and Auger currents. When calculating the carrier densities, the electrons in the barrier regions are properly taken into account. Redistribution of electrons over the active region is shown to increase the threshold current considerably. The dependences of jth and To on temperature, number of QWs, cavity length and lateral size are discussed in detail. The effect of lattice and carrier heating on j(th) and T-0 is investigated and shown to be essential at high temperature.
引用
收藏
页码:1131 / 1140
页数:10
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