Oxide scale stress determination by Raman spectroscopy application to the NiCr/Cr2O3 system and influence of yttrium

被引：50

作者：

Calvarin, G ^{[1
]}

Huntz, AM

Le Goff, AH

Joiret, S

Bernard, MC

机构：

[1] Univ Paris 11, Lab Met Struct, CNRS, URA 1107, F-91405 Orsay, France

[2] Lab Phys Liquides & Electrochim, CNRS, UPR 15, F-75252 Paris 05, France

来源：

SCRIPTA MATERIALIA | 1998年 / 38卷 / 11期

关键词：

D O I：

10.1016/S1359-6462(98)00079-7

中图分类号：

TB3 [工程材料学];

学科分类号：

0805 ; 080502 ;

摘要：

[No abstract available]

引用

页码：1649 / 1658

页数：10

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[7]

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[9] ROOM-TEMPERATURE STRAINS IN CR2O3 SCALES FORMED AT ELEVATED-TEMPERATURES ON NI-25 WT-PERCENT CR AND Y-DOPED AND AL-DOPED NI-25WT-PERCENT CR [J].

HOU, PY ;

STRINGER, J .

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[10]

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