Beam scanning of array using ferroelectric phase shifters

被引：14

作者：

Teo, PT

Jose, KA

Gan, YB

Varadan, VK

机构：

[1] DSO, Natl Labs, Singapore 118230, Singapore

[2] Penn State Univ, Ctr Engn Elect & Acoust Mat, University Pk, PA 16802 USA

来源：

ELECTRONICS LETTERS | 2000年 / 36卷 / 19期

关键词：

D O I：

10.1049/el:20001155

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

The beam scanning characteristics of a two-element array utilising a ferroelectric phase shifter art presented for the first time. Applying a DC voltage across the ferroelectric material changes the velocity of the input signal, a beam scan of 26 degrees being achieved. The S-11 performance and the radiation patterns of the array at two frequencies are presented.

引用

页码：1624 / 1626

页数：3

共 4 条

[1] Beam scanning using microstrip line on biased ferrite [J].