Efficient statistical BJT modeling, why β is more than Ic/Ib

被引：19

作者：

McAndrew, CC ^{[1
]}

Bates, J ^{[1
]}

Ida, RT ^{[1
]}

Drennan, P ^{[1
]}

机构：

[1] Motorola Inc, Tempe, AZ 85284 USA

来源：

PROCEEDINGS OF THE 1997 BIPOLAR/BICMOS CIRCUITS AND TECHNOLOGY MEETING | 1997年

关键词：

D O I：

10.1109/BIPOL.1997.647349

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

This paper presents a new, efficient, accurate method for statistical BJT modeling, using backward propagation of variance (BPV). The method uses process control (PC) data to infer variations in process parameters, including geometry variations, and takes only minutes to run on an engineering workstation.

引用

页码：28 / 31

页数：4