PREVAIL - IBM's e-beam technology for next generation lithography

被引:19
作者
Pfeiffer, HC [1 ]
机构
[1] IBM Corp, Microelect, Semicond Res & Dev Ctr, Hopewell Junction, NY 12533 USA
来源
EMERGING LITHOGRAPHIC TECHNOLOGIES IV | 2000年 / 3997卷
关键词
electron beam lithography; large field/large NA e-beam projection optics; variable axis lenses; geometric aberration correction; Coulomb interaction aberrations;
D O I
10.1117/12.390056
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
PREVAIL - Projection Reduction Exposure with Variable Axis Immersion Lenses represents the high throughput e-beam projection approach to NGL which IBM is pursuing in cooperation with Nikon Corporation as alliance partner. This paper discusses the challenges and accomplishments of the PREVAIL project. The supreme challenge facing all e-beam lithography approaches has been and still is throughput. Since the throughput of e-beam projection systems is severely limited by the available optical field size, the key to success is the ability to overcome this limitation. The PREVAIL technique overcomes field-limiting off-axis aberrations through the use of variable axis lenses, which electronically shift the optical axis simultaneously with the deflected beam so that the beam effectively remains on axis. The resist images obtained with the Proof-of-Concept (POC) system demonstrate that PREVAIL effectively eliminates off-axis aberrations affecting both resolution and placement accuracy of pixels. As part of the POC system a high emmitance gun has been developed to provide uniform illumination of the patterned subfield and to fill, the large numerical aperture projection optics designed to significantly reduce beam blur caused by Coulomb interaction.
引用
收藏
页码:206 / 213
页数:8
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