Characterization of self-similar dislocation patterns by x-ray diffraction

被引：21

作者：

Székely, F ^{[1
]}

Groma, I ^{[1
]}

Lendvai, J ^{[1
]}

机构：

[1] Eotvos Lorand Univ, Dept Gen Phys, H-1518 Budapest, Hungary

来源：

PHYSICAL REVIEW B | 2000年 / 62卷 / 05期

关键词：

D O I：

10.1103/PhysRevB.62.3093

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

Copper single crystals deformed in uniaxial compression were investigated by x-ray line profile analysis, and the resulting statistical parameters of the developed dislocation pattern are compared to the fractal dimension of the dislocation network determined by the box-counting method on transmission electron microscope micrograph. The observed correlation between the relative fluctuation of the dislocation density and the fractal dimension of the dislocation pattern is interpreted on the basis of the generalized (fractal) composite model.

引用

页码：3093 / 3098

页数：6

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