Interlayer tunneling spectroscopy and evidence for the evolution of a pseudogap in Bi2Sr2CaCu2O8

被引:31
作者
Suzuki, M [1 ]
Karimoto, S [1 ]
Namekawa, K [1 ]
机构
[1] NTT Corp, NTT Basic Res Labs, Tokai, Ibaraki 3191193, Japan
关键词
Bi2Sr2CaCu2O8; interlayer tunneling; intrinsic Josephson junction; tunneling spectroscopy; pseudogap;
D O I
10.1143/JPSJ.67.732
中图分类号
O4 [物理学];
学科分类号
0702 ;
摘要
We report on interlayer tunneling spectroscopy using very thin stacks of intrinsic Josephson junctions fabricated on the surface of a Bi2Sr2CaCu2O8 Single crystal. It is found that a pseudogap evolves below 180 K and continues to exist below T-c. It is also found that the superconducting gap evolves below T-c within the pseudogap. As a consequence of this finding, it is shown that the semiconductive c-axis resistivity can be interpreted in a straightforward manner in terms of the pseudogap and that the tunneling resistance is temperature independent.
引用
收藏
页码:732 / 735
页数:4
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