Optimization of a bent perfect Si(111) monochromator at a small take-off angle for use in a stress instrument

被引：21

作者：

Seong, Baek-Seok ^{[1
]}

Em, Vyacheslav ^{[1
]}

Mikula, Pavol ^{[2
,3
]}

Saroun, Jan ^{[2
,3
]}

Kang, Mi-Hyun ^{[1
,4
]}

机构：

[1] Korea Atom Energy Res Inst, Div Neutron Sci, Daedok 1045, South Korea

[2] Res Ctr Rez Ltd, Rez, Czech Republic

[3] Nucl Phys Inst ASCR, VVI, Rez, Czech Republic

[4] Chungnam Natl Univ, Taejon 305764, South Korea

来源：

JOURNAL OF APPLIED CRYSTALLOGRAPHY | 2010年 / 43卷

关键词：

SENSITIVE NEUTRON DETECTOR; DIFFRACTION; OPTICS;

D O I：

10.1107/S0021889810008551

中图分类号：

O6 [化学];

学科分类号：

0703 ;

摘要：

The reflectivity and resolution properties of focusing cylindrically bent perfect crystal Si(111) monochromators of different diffraction geometries were tested with the aim of evaluating their possible use in a stress instrument with an unusually small take-off angle (2 theta(M) similar or equal to 30 degrees). The experiments showed that an Si crystal with reflecting planes (111) in the symmetric diffraction geometry provides a maximum figure of merit for accuracy in the peak position that is comparable to that achieved previously from an optimized Si(220) monochromator at 2 theta(M) similar or equal to 55 degrees

引用

页码：654 / 658

页数：5

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