Secondary ion mass spectroscopy study of failure mechanism in organic light emitting devices

被引：6

作者：

Ke, L ^{[1
]}

Zhang, K ^{[1
]}

Yakovlev, N ^{[1
]}

Chua, SJ ^{[1
]}

Chen, P ^{[1
]}

机构：

[1] Inst Mat Res & Engn, Singapore 117602, Singapore

来源：

MATERIALS SCIENCE AND ENGINEERING B-SOLID STATE MATERIALS FOR ADVANCED TECHNOLOGY | 2003年 / 97卷 / 01期

关键词：

mass spectroscopy; cathode imperfection; polymer;

D O I：

10.1016/S0921-5107(02)00129-0

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

Secondary ion mass spectroscopy is used to examine the dark, non-emissive defects in organic light-emitting devices. Movements in the interfaces between the electrodes and polymer originate from electrode imperfections. Due to the soft polymer layer, the Indium and Calcium elements migrate under electrical stress and their profiles overlap to a large extent in the dark spot areas. The proximity between the Indium tin oxide sharp spikes and cathode metal protrusions lead to the large current flow initiating the formation of dark spots. We demonstrate that the presence of cathode imperfection and interface roughness of different layers correlate well with the formation of device dark spots. (C) 2002 Elsevier Science B.V. All rights reserved.

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页码：1 / 4

页数：4

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