共 30 条
Flat-field grating spectrometer for high-resolution soft x-ray and extreme ultraviolet measurements on an electron beam ion trap
被引:84
作者:

Beiersdorfer, P
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机构:
Lawrence Livermore Natl Lab, Livermore, CA 94550 USA Lawrence Livermore Natl Lab, Livermore, CA 94550 USA

Magee, EW
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机构: Lawrence Livermore Natl Lab, Livermore, CA 94550 USA

Träbert, E
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机构: Lawrence Livermore Natl Lab, Livermore, CA 94550 USA

Chen, H
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机构: Lawrence Livermore Natl Lab, Livermore, CA 94550 USA

Lepson, JK
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机构: Lawrence Livermore Natl Lab, Livermore, CA 94550 USA

Gu, MF
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机构: Lawrence Livermore Natl Lab, Livermore, CA 94550 USA

Schmidt, M
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机构: Lawrence Livermore Natl Lab, Livermore, CA 94550 USA
机构:
[1] Lawrence Livermore Natl Lab, Livermore, CA 94550 USA
[2] Univ Calif Berkeley, Berkeley, CA 94720 USA
[3] Stanford Univ, Palo Alto, CA 94305 USA
[4] Tech Univ Dresden, D-8027 Dresden, Germany
关键词:
D O I:
10.1063/1.1779609
中图分类号:
TH7 [仪器、仪表];
学科分类号:
0804 ;
080401 ;
081102 ;
摘要:
A R=44.3 m grazing-incidence grating spectrometer has been implemented on the Livermore electron beam ion traps for high-resolution measurements in the soft x-ray and extreme ultraviolet region spanning from below 10 up to 50 Angstrom. The instrument uses a grating with variable line spacing (about 2400 l/mm for a flat field of view. Spectra are recorded with a back-illuminated charge-coupled device detector. The new instrument greatly improves upon the resolution achieved with existing grating spectrometers and complements crystal spectrometers at the shorter wavelengths both in terms of wavelength coverage and polarization independent reflectivity response. (C) 2004 American Institute of Physics.
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页码:3723 / 3726
页数:4
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机构: Space Res Org Netherlands, NL-3584 CA Utrecht, Netherlands

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机构: Space Res Org Netherlands, NL-3584 CA Utrecht, Netherlands

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机构: Space Res Org Netherlands, NL-3584 CA Utrecht, Netherlands

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机构: Space Res Org Netherlands, NL-3584 CA Utrecht, Netherlands